Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
电化学原子力显微镜的应用 | |
Alternative Title | Application of electrochemical atomic force microscopy |
Li, XJ(李晓军); He, PG; Fang, YX; Hu, J(胡钧); Li, MQ(李名乾) | |
2004 | |
Source Publication | 分析化学
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ISSN | 0253-3820 |
Volume | 32Issue:3Pages:395-401 |
Abstract | The principle and technique of electrochemical atomic force microscopy(EC-AFM) are briefly surveyed. The application of in-situ AFM in electrochemistry and electroanalytical chemistry is critically evaluated, such as observing the process of electrodeposition, corrosion and anti-corrosion, observing the process and properties of film formed by electrodeposition, measuring the electrostatic force between two surfaces and so on. It also describes the integrated EC-AFM. |
Indexed By | SCI |
Language | 中文 |
Funding Project | 应物所项目组 |
WOS ID | WOS:000220700500029 |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.sinap.ac.cn/handle/331007/9388 |
Collection | 中科院上海应用物理研究所2004-2010年 |
Recommended Citation GB/T 7714 | Li, XJ(李晓军),He, PG,Fang, YX,等. 电化学原子力显微镜的应用[J]. 分析化学,2004,32(3):395-401. |
APA | Li, XJ,He, PG,Fang, YX,Hu, J,&Li, MQ.(2004).电化学原子力显微镜的应用.分析化学,32(3),395-401. |
MLA | Li, XJ,et al."电化学原子力显微镜的应用".分析化学 32.3(2004):395-401. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
Application of elect(302KB) | 期刊论文 | 出版稿 | 开放获取 | CC BY-NC-SA | View Application Full Text |
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