CAS OpenIR  > 中科院上海应用物理研究所2004-2010年
Application of electrochemical atomic force microscopy
Li, XJ(李晓军); He, PG; Fang, YX; Hu, J(胡钧); Li, MQ(李名乾)
AbstractThe principle and technique of electrochemical atomic force microscopy(EC-AFM) are briefly surveyed. The application of in-situ AFM in electrochemistry and electroanalytical chemistry is critically evaluated, such as observing the process of electrodeposition, corrosion and anti-corrosion, observing the process and properties of film formed by electrodeposition, measuring the electrostatic force between two surfaces and so on. It also describes the integrated EC-AFM.
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Funding Project应物所项目组
WOS IDWOS:000220700500029
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Document Type期刊论文
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GB/T 7714
Li, XJ,He, PG,Fang, YX,et al. Application of electrochemical atomic force microscopy[J]. CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,2004,32(3):395.
APA Li, XJ,He, PG,Fang, YX,Hu, J,&Li, MQ.(2004).Application of electrochemical atomic force microscopy.CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,32(3),395.
MLA Li, XJ,et al."Application of electrochemical atomic force microscopy".CHINESE JOURNAL OF ANALYTICAL CHEMISTRY 32.3(2004):395.
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