Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Application of electrochemical atomic force microscopy | |
| Li, XJ(李晓军）; He, PG; Fang, YX; Hu, J（胡钧）; Li, MQ（李名乾） | |
| 2004 | |
| Source Publication | CHINESE JOURNAL OF ANALYTICAL CHEMISTRY
 |
| ISSN | 0253-3820 |
| Volume | 32Issue:3Pages:395 |
| Abstract | The principle and technique of electrochemical atomic force microscopy(EC-AFM) are briefly surveyed. The application of in-situ AFM in electrochemistry and electroanalytical chemistry is critically evaluated, such as observing the process of electrodeposition, corrosion and anti-corrosion, observing the process and properties of film formed by electrodeposition, measuring the electrostatic force between two surfaces and so on. It also describes the integrated EC-AFM. |
| Indexed By | SCI |
| Language | 中文 |
| Funding Project | 应物所项目组 |
| WOS ID | WOS:000220700500029 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/9388 |
| Collection | 中科院上海应用物理研究所2004-2010年 |
| Recommended Citation GB/T 7714 | Li, XJ,He, PG,Fang, YX,et al. Application of electrochemical atomic force microscopy[J]. CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,2004,32(3):395. |
| APA | Li, XJ,He, PG,Fang, YX,Hu, J,&Li, MQ.(2004).Application of electrochemical atomic force microscopy.CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,32(3),395. |
| MLA | Li, XJ,et al."Application of electrochemical atomic force microscopy".CHINESE JOURNAL OF ANALYTICAL CHEMISTRY 32.3(2004):395. |
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