电化学原子力显微镜的应用

CAS OpenIR > 中科院上海应用物理研究所2004-2010年

	电化学原子力显微镜的应用
Alternative Title	Application of electrochemical atomic force microscopy
	Li, XJ(李晓军）; He, PG; Fang, YX; Hu, J（胡钧）; Li, MQ（李名乾）
	2004
Source Publication	分析化学
ISSN	0253-3820
Volume	32 Issue:3 Pages:395-401
Abstract	The principle and technique of electrochemical atomic force microscopy(EC-AFM) are briefly surveyed. The application of in-situ AFM in electrochemistry and electroanalytical chemistry is critically evaluated, such as observing the process of electrodeposition, corrosion and anti-corrosion, observing the process and properties of film formed by electrodeposition, measuring the electrostatic force between two surfaces and so on. It also describes the integrated EC-AFM.
Indexed By	SCI
Language	中文
Funding Project	应物所项目组
WOS ID	WOS:000220700500029
Citation statistics	Cited Times:2[WOS] [WOS Record] [Related Records in WOS]
Document Type	期刊论文
Identifier	http://ir.sinap.ac.cn/handle/331007/9388
Collection	中科院上海应用物理研究所2004-2010年
Recommended Citation GB/T 7714	Li, XJ(李晓军),He, PG,Fang, YX,等. 电化学原子力显微镜的应用[J]. 分析化学,2004,32(3):395-401.
APA	Li, XJ,He, PG,Fang, YX,Hu, J,&Li, MQ.(2004).电化学原子力显微镜的应用.分析化学,32(3),395-401.
MLA	Li, XJ,et al."电化学原子力显微镜的应用".分析化学 32.3(2004):395-401.

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