CAS OpenIR  > 中科院上海应用物理研究所2011-2019年
Influencing factors on local reduction of graphene oxide with a heated AFM tip
Wu Zhongliang; Shen Yue; Zhou Xingfei; Guo Shouwu; Zhang Yi(张益)
2011
Source PublicationNUCLEAR SCIENCE AND TECHNIQUES
ISSN1001-8042
Volume22Issue:4Pages:245
AbstractIn this paper, the factors influencing the local thermal reduction of graphene oxide (GO) sheets are investigated. The lateral force microscopy and scanning polarization force microscopy verify that the heated tips of atomic force microscope (AFM) can thermally reduce the GO into electrical conductive nanostructures. The tip temperature, heating time, and loading force applied by the AFM tip are found to have important effects on the thermal reduction of GO, while the environmental humidity is negligible.
Indexed BySCI
Language英语
Funding Project应物所项目组
WOS IDWOS:000294942400010
Citation statistics
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/9527
Collection中科院上海应用物理研究所2011-2019年
Recommended Citation
GB/T 7714
Wu Zhongliang,Shen Yue,Zhou Xingfei,et al. Influencing factors on local reduction of graphene oxide with a heated AFM tip[J]. NUCLEAR SCIENCE AND TECHNIQUES,2011,22(4):245.
APA Wu Zhongliang,Shen Yue,Zhou Xingfei,Guo Shouwu,&Zhang Yi.(2011).Influencing factors on local reduction of graphene oxide with a heated AFM tip.NUCLEAR SCIENCE AND TECHNIQUES,22(4),245.
MLA Wu Zhongliang,et al."Influencing factors on local reduction of graphene oxide with a heated AFM tip".NUCLEAR SCIENCE AND TECHNIQUES 22.4(2011):245.
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