CAS OpenIR  > 中科院上海原子核所2003年前
A very simple method for true elemental mapping using the scanning proton microprobe
Li, XL(李晓林); Zhu, JQ(朱节清); Lu, RR; Wu, XK; Chen, YH
1997
Conference Name5th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA)
Source PublicationNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Pages149
Conference DateNOV 11-15, 1996
Conference PlaceSANTA FE, NM
AbstractAn elemental map by means of SPM is traditionally obtained by total counts entering an energy window (TCEW) corresponding to a characteristic X-ray of that element. Besides the characteristic X-ray signals of the element, the total counts contain the contribution of continuum background and overlapping peaks of the interfering elements as well. A method called NCEW (net counts entering an energy window) has been developed for off-line true elemental mapping. The continuum background is calculated with a trapezoid area determined by the counts within border gates and is subtracted from the total counts of the peak. The branch ratios of the characteristic X-rays of the interfering elements are used to correct their overlapping peaks. Because the net counts eliminate the contribution of the background and the overlapping peaks from the total counts, the map obtained by the NCEW is free of artifacts due to the continuum background and the peak overlapping. This method was tested by scanning a microbeam over a multi-foil target. Applications of the NCEW method to some environmental and geological samples are described. (C) 1997 Elsevier Science B.V.
ISSN0168-583X
Indexed BySCI
Funding Project应物所课题组
Language英语
Document Type会议论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/9782
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
Li, XL,Zhu, JQ,Lu, RR,et al. A very simple method for true elemental mapping using the scanning proton microprobe[C],1997:149.
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