CAS OpenIR  > 中科院上海原子核所2003年前
Direct detection of mutation sites on stretched DNA by atomic force microscopy
Zhang, Y(张益); Lu, YT; Hu, J(胡钧); Kong, XY; Li, B(李宾); Zhao, GP; Li, MQ(李民乾)
2002
Conference NameSXM 4 Conference
Source PublicationSURFACE AND INTERFACE ANALYSIS
Pages122
Conference Date2000
Conference PlaceMUNSTER, GERMANY
AbstractBased on MutS protein recognition of heteroduplex DNA, here we report an approach by using atomic force microscopy (AFM) in combination with a DNA stretching technique for detecting small DNA alternations. The AFM studies showed that the binding ratio of heteroduplex DNA to MutS was higher than that of homoduplex DNA. The data also showed that the stretching operation caused little change to the binding ratios of both heteroduplex and homoduplex DNA. By stretching the MutS-bound DNA, the distances from MutS binding sites to the DNA ends could be measured directly using AFM and the position of the binding sites could be measured. Because of the DNA stretching operation, this method will be competent to detect unpaired or mismatched sites on long DNA molecules in a direct and visual way. Copyright (C) 2002 John Wiley Sons, Ltd.
ISSN0142-2421
Indexed BySCI
Funding Project应物所课题组
Language英语
Document Type会议论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/9795
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
Zhang, Y,Lu, YT,Hu, J,et al. Direct detection of mutation sites on stretched DNA by atomic force microscopy[C],2002:122.
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