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Characteristics of Pt/PbZr0.52Ti0.48O3/Pt and Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors after gamma-ray irradiation | |
Gao, J; Zheng, L; Song, Z; Lin, C; Zhu, D | |
1999 | |
Source Publication | EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS
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ISSN | 1286-0042 |
Volume | 8Issue:2Pages:105 |
Abstract | PbZr0.52Ti0.48O3 (PZT) and YBa2Cu3O7-delta (YBCO) thin films were fabricated by a pulsed laser deposition (PLD) method. The Pt/PZT/Pt ferroelectric capacitors were fabricated on silicon substrates while the Au/PZT/YBCO capacitors were fabricated on LaAlO3 substrates. The capacitance-voltage (C-V) properties and the hysteresis loops of the capacitors were measured before and after gamma-ray irradiation. The results show that for Pt/PZT/Pt capacitors, the remanent polarization P-r and the absolute coercive field E-C increase while the dielectric constant epsilon decrease with increasing accumulated dose. For the Au/PZT/YBCO capacitors, P-r and epsilon decreased with accumulated dose, but the absolute value of the negative and positive coercive fields increased. The results have been interpreted by radiation-induced positive charge trapping at defects in the ferroelectric materials. |
Indexed By | SCI |
Language | 英语 |
Funding Project | 应物所项目组 |
WOS ID | WOS:000084474200002 |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.sinap.ac.cn/handle/331007/9896 |
Collection | 中科院上海原子核所2003年前 |
Recommended Citation GB/T 7714 | Gao, J,Zheng, L,Song, Z,et al. Characteristics of Pt/PbZr0.52Ti0.48O3/Pt and Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors after gamma-ray irradiation[J]. EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS,1999,8(2):105. |
APA | Gao, J,Zheng, L,Song, Z,Lin, C,&Zhu, D.(1999).Characteristics of Pt/PbZr0.52Ti0.48O3/Pt and Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors after gamma-ray irradiation.EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS,8(2),105. |
MLA | Gao, J,et al."Characteristics of Pt/PbZr0.52Ti0.48O3/Pt and Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors after gamma-ray irradiation".EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS 8.2(1999):105. |
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