CAS OpenIR  > 中科院上海原子核所2003年前
Characteristics of Pt/PbZr0.52Ti0.48O3/Pt and Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors after gamma-ray irradiation
Gao, J; Zheng, L; Song, Z; Lin, C; Zhu, D
1999
Source PublicationEUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS
ISSN1286-0042
Volume8Issue:2Pages:105
AbstractPbZr0.52Ti0.48O3 (PZT) and YBa2Cu3O7-delta (YBCO) thin films were fabricated by a pulsed laser deposition (PLD) method. The Pt/PZT/Pt ferroelectric capacitors were fabricated on silicon substrates while the Au/PZT/YBCO capacitors were fabricated on LaAlO3 substrates. The capacitance-voltage (C-V) properties and the hysteresis loops of the capacitors were measured before and after gamma-ray irradiation. The results show that for Pt/PZT/Pt capacitors, the remanent polarization P-r and the absolute coercive field E-C increase while the dielectric constant epsilon decrease with increasing accumulated dose. For the Au/PZT/YBCO capacitors, P-r and epsilon decreased with accumulated dose, but the absolute value of the negative and positive coercive fields increased. The results have been interpreted by radiation-induced positive charge trapping at defects in the ferroelectric materials.
Indexed BySCI
Language英语
Funding Project应物所项目组
WOS IDWOS:000084474200002
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/9896
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
Gao, J,Zheng, L,Song, Z,et al. Characteristics of Pt/PbZr0.52Ti0.48O3/Pt and Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors after gamma-ray irradiation[J]. EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS,1999,8(2):105.
APA Gao, J,Zheng, L,Song, Z,Lin, C,&Zhu, D.(1999).Characteristics of Pt/PbZr0.52Ti0.48O3/Pt and Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors after gamma-ray irradiation.EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS,8(2),105.
MLA Gao, J,et al."Characteristics of Pt/PbZr0.52Ti0.48O3/Pt and Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors after gamma-ray irradiation".EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS 8.2(1999):105.
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