CAS OpenIR  > 中科院上海原子核所2003年前
Direct detection of mutation sites on stretched DNA by atomic force microscopy
Zhang, Y(张益); Lu, YT; Hu, J(胡钧); Kong, XY; Li, B(李宾); Zhao, GP; Li, MQ(李民乾)
2002
Source PublicationSURFACE AND INTERFACE ANALYSIS
ISSN0142-2421
Volume33Issue:2Pages:122
AbstractBased on MutS protein recognition of heteroduplex DNA, here we report an approach by using atomic force microscopy (AFM) in combination with a DNA stretching technique for detecting small DNA alternations. The AFM studies showed that the binding ratio of heteroduplex DNA to MutS was higher than that of homoduplex DNA. The data also showed that the stretching operation caused little change to the binding ratios of both heteroduplex and homoduplex DNA. By stretching the MutS-bound DNA, the distances from MutS binding sites to the DNA ends could be measured directly using AFM and the position of the binding sites could be measured. Because of the DNA stretching operation, this method will be competent to detect unpaired or mismatched sites on long DNA molecules in a direct and visual way. Copyright (C) 2002 John Wiley Sons, Ltd.
Indexed BySCI
Language英语
Funding Project应物所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/9934
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
Zhang, Y,Lu, YT,Hu, J,et al. Direct detection of mutation sites on stretched DNA by atomic force microscopy[J]. SURFACE AND INTERFACE ANALYSIS,2002,33(2):122.
APA Zhang, Y.,Lu, YT.,Hu, J.,Kong, XY.,Li, B.,...&Li, MQ.(2002).Direct detection of mutation sites on stretched DNA by atomic force microscopy.SURFACE AND INTERFACE ANALYSIS,33(2),122.
MLA Zhang, Y,et al."Direct detection of mutation sites on stretched DNA by atomic force microscopy".SURFACE AND INTERFACE ANALYSIS 33.2(2002):122.
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