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基于单模光纤光源的大口径细光束自准直技术的研究 学位论文
: 中国科学院大学(中国科学院上海应用物理研究所), 2018
Authors:  赵玉平
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自准直仪  单模光纤光源  细光束  误差源  精度  
Optimization of pencil beam f-theta lens for high-accuracy metrology 期刊论文
OPTICAL ENGINEERING, 2018, 卷号: 57, 期号: 1, 页码: -
Authors:  Peng, CQ;  He, YM;  Wang, J
Adobe PDF(1178Kb)  |  Favorite  |  View/Download:188/104  |  Submit date:2018/09/06
Long Trace Profiler  Surface Profiler  Deflectometry  Ellipse  Mirrors  Circle  Range  
扫描型表面斜率测量的方法研究 学位论文
: 中国科学院研究生院(上海应用物理研究所), 2017
Authors:  彭川黔
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法线追迹方法  同步辐射光源  X射线反射镜面  长程面形仪  F-theta透镜  
Zonal wavefront reconstruction in quadrilateral geometry for phase measuring deflectometry 期刊论文
APPLIED OPTICS, 2017, 卷号: 56, 期号: 18, 页码: 5139-5144
Authors:  Huang, L;  Xue, JP;  Gao, B;  Zuo, C;  Idir, M
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Least-squares Integration  Stereo Deflectometry  Gradient Data  Calibration  Improvement  Spline  Shape  
Normal tracing deflectometry using a secondary light source 期刊论文
JOURNAL OF SYNCHROTRON RADIATION, 2017, 卷号: 24, 期号: -, 页码: 765-774
Authors:  Peng, CQ;  He, YM;  Wang, J
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Surface Profiler  Accuracy  Mirrors  
Spline based least squares integration for two-dimensional shape or wavefront reconstruction 期刊论文
OPTICS AND LASERS IN ENGINEERING, 2017, 卷号: 91, 页码: 221-226
Authors:  Huang, L;  Xue, JP;  Gao, B;  Zuo, C;  Idir, M
Adobe PDF(1493Kb)  |  Favorite  |  View/Download:171/53  |  Submit date:2017/12/08
Shape Reconstruction From Gradient  Wavefront Reconstruction  Splines  
Model mismatch analysis and compensation for modal phase measuring deflectometry 期刊论文
OPTICS EXPRESS, 2017, 卷号: 25, 期号: 2, 页码: 881-887
Authors:  Huang, L;  Xue, JP;  Gao, B;  McPherson, C;  Beverage, J;  Idir, M
Adobe PDF(2471Kb)  |  Favorite  |  View/Download:119/20  |  Submit date:2017/12/08
Modal phase measuring deflectometry 期刊论文
OPTICS EXPRESS, 2016, 卷号: 24, 期号: 21, 页码: 24649-24664
Authors:  Huang, L;  Xue, JP;  Gao, B;  McPherson, C;  Beverage, J;  Idir, M;  Huang, L (reprint author), Brookhaven Natl Lab, NSLS II, 50 Rutherford Dr, Upton, NY 11973 USA.
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Nano-accuracy measurement technology of optical-surface profiles 会议论文
, Suzhou, PEOPLES R CHINA, APR 26-29, 2016
Authors:  Qian, SN;  Gao, B;  Qian, SN (reprint author), Brookhaven Natl Lab, Upton, NY 11973 USA.
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Surface Profiler  Profilometer  Nano-accuracy  Preccise Measurement