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Thickness-dependent structural characteristics for a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers 期刊论文
JOURNAL OF SYNCHROTRON RADIATION, 2018, 卷号: 25, 页码: 785-792
Authors:  Jiang, H;  Wang, H;  Zhu, JT;  Xue, CF;  Zhang, JY;  Tian, NX;  Li, AG
View  |  Adobe PDF(1482Kb)  |  Favorite  |  View/Download:39/8  |  Submit date:2018/09/06
Nitride Thin-films  X-ray Mirrors  Surface-morphology  Optical-surfaces  Growth  Roughness  Layer  Microstructure  Reflectivity  Spectroscopy  
Structural and Optical Properties of Ti-Doped InTe Thin Films 期刊论文
JOURNAL OF PHYSICAL CHEMISTRY C, 2018, 卷号: 122, 期号: 11, 页码: 6267-6272
Authors:  Yuan, YF;  Liu, CM;  Su, J;  Cheng, L;  Fang, J;  Zhang, XT;  Sun, Y;  Wu, YQ;  Zhang, H;  Li, J
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Chalcogenide Glasses  Electrical-properties  Nonlinearity  Absorption  Dependence  
The Evidence of Giant Surface Flexoelectric Field in (111) Oriented BiFeO3 Thin Film 期刊论文
ACS APPLIED MATERIALS & INTERFACES, 2017, 卷号: 9, 期号: 6, 页码: 5600-5606
Authors:  Yang, TY;  Zhang, XM;  Chen, B;  Guo, HZ;  Jin, KJ;  Wu, XS;  Gao, XY;  Li, Z;  Wang, C;  Li, XL
View  |  Adobe PDF(2577Kb)  |  Favorite  |  View/Download:57/22  |  Submit date:2017/12/08
Surface Layer  Ferroelectric Thin Films  X-ray Diffraction  Flexoelectrics  Microstructure  
Numerical modeling of thermal loading of diamond crystal in X-ray FEL oscillators 期刊论文
CHINESE PHYSICS C, 2016, 卷号: 40, 期号: 4, 页码: —
Authors:  Song, MQ;  Zhang, QM;  Guo, YH;  Li, K;  Deng, HX;  Zhang, QM (reprint author), Xi An Jiao Tong Univ, Sch Energy & Power Engn, Dept Nucl Sci & Technol, Xian 710049, Peoples R China.
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Free-electron Laser  
Probing the surface microstructure of layer-by-layer self-assembly chitosan/poly(L-glutamic acid) multilayers: A grazing-incidence small-angle X-ray scattering study 期刊论文
MATERIALS SCIENCE & ENGINEERING C-MATERIALS FOR BIOLOGICAL APPLICATIONS, 2016, 卷号: 58, 期号: -, 页码: 352—358
Authors:  Zhao, N;  Yang, CM;  Wang, YZ;  Zhao, BY;  Sian, FG;  Li, XH;  Wang, J;  Yang, CM (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China.
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Atomic-force Microscopy  Polyelectrolyte Multilayers  Thin-films  Poly(L-glutamic Acid)  Exponential-growth  Charged Surfaces  Drug-delivery  Chitosan  Complex  Salt  
Ultrafast Jahn-Teller polaron dynamics in a bi-layered manganite single crystal 期刊论文
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2016, 卷号: 10, 期号: 7, 页码: 558-562
Authors:  Wang, HZ;  Deng, DM;  Zhang, ZY;  Xu, K;  Pan, QF;  Lin, X;  Yan, L;  Cao, SX;  Cheng, ZX;  Jin, ZM;  Ma, GH;  Jin, ZM (reprint author), Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China.
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Polarons  Manganites  Ultrafast Transient Reflection Spectroscopy  
Investigation of defects in sputtered W/B4C multilayers 期刊论文
APPLIED SURFACE SCIENCE, 2015, 卷号: 357, 页码: 1180—1186
Authors:  Jiang, H;  Yan, S;  Zhu, JT;  Dong, ZH;  Zheng, Y;  He, YM;  Li, AG;  Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
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Atomic-force Microscopy  Optical Applications  Diffuse-scattering  Tungsten-oxide  Thin-films  Coatings  Reflectivity  Interface  Cracking  Stress  
Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses 期刊论文
JOURNAL OF SYNCHROTRON RADIATION, 2015, 卷号: 22, 页码: 1379—1385
Authors:  Jiang, H;  He, Y;  He, YM;  Li, AG;  Wang, H;  Zheng, Y;  Dong, ZH;  Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
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Coherent Synchrotron-radiation  X-ray  Total-reflection  Scattering  Optics  
Development of XUV multilayer gratings with high resolution and high efficiency 会议论文
, Prague, CZECH REPUBLIC, APR 13-14, 2015
Authors:  Yang, XW;  Huang, QS;  Kozhevnikov, IV;  Wang, ZS;  Zhao, J;  Wu, YQ;  Yang, XW (reprint author), Tongji Univ, Sch Phys Sci & Engn, Inst Precis Opt Engn, MOE Key Lab Adv Micro Struct Mat, Shanghai 200092, Peoples R China.
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Diffraction Efficiency  Enhancement  Wavelength  Operation  
Depth-dependent inhomogeneous characteristics in supported glassy polystyrene films revealed by ultra-low X-ray reflectivity measurements 期刊论文
POLYMER JOURNAL, 2014, 卷号: 46, 期号: 12, 页码: 873—879
Authors:  Yang, CM;  Ishimoto, K;  Matsuura, S;  Koyasu, N;  Takahashi, I;  yangchunming@sinap.ac.cn;  z96019@kwansei.ac.jp
Adobe PDF(1390Kb)  |  Favorite  |  View/Download:79/28  |  Submit date:2015/03/13
Thin Polymer Layers  Transition Temperatures  Molecular-weight  Dynamics  Interface  Surface  Motion  Confinement  Thickness  Mobility