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Study on Adhesive Strength between Ge(2)Sb(2)Te(5) Film and Electrodes for Phase Change Memory Application 期刊论文
JAPANESE JOURNAL OF APPLIED PHYSICS, 2009, 卷号: 48, 期号: 10, 页码: 5
Authors:  Liu, YB;  Zhang, T;  Zhang, GX(张国欣);  Niu, XM;  Song, ZT;  Min, GQ;  Lin, Y;  Zhang, J;  Zhou, WM;  Zhang, JP;  Chu, JT;  Wan, YZ;  Feng, SL;  Liu, YB (reprint author), Shanghai Nanotechnol Promot Ctr, Lab Nanotechnol, Shanghai 200237, Peoples R China
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腐蚀疲劳断裂过程中氢与缺陷相互作用的正电子湮没研究 期刊论文
核技术, 1993, 期号: 06
Authors:  俞方华;  郑文龙;  苏立民;  朱锡英;  闵国全;  项开华
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腐蚀疲劳断裂前氢与缺陷相互作用的正电子湮没研究 期刊论文
核技术, 1993, 期号: 03
Authors:  俞方华;  郑万辉;  郑文龙;  朱锡英;  苏立民;  闵国全
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