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Investigation of defects in sputtered W/B4C multilayers 期刊论文
APPLIED SURFACE SCIENCE, 2015, 卷号: 357, 页码: 1180—1186
Authors:  Jiang, H;  Yan, S;  Zhu, JT;  Dong, ZH;  Zheng, Y;  He, YM;  Li, AG;  Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
View  |  Adobe PDF(3057Kb)  |  Favorite  |  View/Download:57/19  |  Submit date:2016/03/04
Atomic-force Microscopy  Optical Applications  Diffuse-scattering  Tungsten-oxide  Thin-films  Coatings  Reflectivity  Interface  Cracking  Stress  
Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering 期刊论文
JOURNAL OF SYNCHROTRON RADIATION, 2014, 卷号: 21, 页码: 97—103
Authors:  Li, HC;  Zhu, JT;  Wang, ZS;  Chen, H;  Wang, YZ;  Wang, J;  jtzhu@tongji.edu.cn
Adobe PDF(845Kb)  |  Favorite  |  View/Download:91/39  |  Submit date:2015/03/13
Sputtering Pressure  Diffuse-scattering  Roughness  Performance  Surface  Film