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Investigation of defects in sputtered W/B4C multilayers 期刊论文
APPLIED SURFACE SCIENCE, 2015, 卷号: 357, 页码: 1180—1186
Authors:  Jiang, H;  Yan, S;  Zhu, JT;  Dong, ZH;  Zheng, Y;  He, YM;  Li, AG;  Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
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Atomic-force Microscopy  Optical Applications  Diffuse-scattering  Tungsten-oxide  Thin-films  Coatings  Reflectivity  Interface  Cracking  Stress