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Thickness-dependent structural characteristics for a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers 期刊论文
JOURNAL OF SYNCHROTRON RADIATION, 2018, 卷号: 25, 页码: 785-792
Authors:  Jiang, H;  Wang, H;  Zhu, JT;  Xue, CF;  Zhang, JY;  Tian, NX;  Li, AG
View  |  Adobe PDF(1482Kb)  |  Favorite  |  View/Download:48/10  |  Submit date:2018/09/06
Nitride Thin-films  X-ray Mirrors  Surface-morphology  Optical-surfaces  Growth  Roughness  Layer  Microstructure  Reflectivity  Spectroscopy  
Investigation of defects in sputtered W/B4C multilayers 期刊论文
APPLIED SURFACE SCIENCE, 2015, 卷号: 357, 页码: 1180—1186
Authors:  Jiang, H;  Yan, S;  Zhu, JT;  Dong, ZH;  Zheng, Y;  He, YM;  Li, AG;  Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
View  |  Adobe PDF(3057Kb)  |  Favorite  |  View/Download:57/19  |  Submit date:2016/03/04
Atomic-force Microscopy  Optical Applications  Diffuse-scattering  Tungsten-oxide  Thin-films  Coatings  Reflectivity  Interface  Cracking  Stress  
A general model for estimating the ordering of mesoporous film by grazing incidence small angle X-ray scattering 期刊论文
JOURNAL OF APPLIED PHYSICS, 2014, 卷号: 115, 期号: 20
Authors:  Zhao, N;  Yang, CM;  Zhang, Q;  Lu, XM;  Wang, YZ;  Wang, J;  yangchunming@sinap.ac.cn;  wangyuzhu@sinap.ac.cn;  wangjie@sinap.ac.cn
Adobe PDF(3669Kb)  |  Favorite  |  View/Download:112/38  |  Submit date:2015/03/13
Silica Thin-films  One-dimensional Paracrystal  Neutron-scattering  Mesostructured Silica  Size  Mesochannels  Reflectivity  Orientation  Diffraction  Alignment  
Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples 期刊论文
JOURNAL OF SYNCHROTRON RADIATION, 2014, 卷号: 21, 页码: 561—567
Authors:  Li, WB;  Yang, XY;  Zhu, JT;  Tu, YC;  Mu, BZ;  Yu, HS;  Wei, XJ;  Huang, YY;  Wang, ZS;  wangzs@tongji.edu.cn
Adobe PDF(707Kb)  |  Favorite  |  View/Download:100/35  |  Submit date:2015/03/13
Thin-films  Concentrated Samples  Scattering  Spectra  Reflectivity  Parameter  Exafs  Xafs