CAS OpenIR

Browse/Search Results:  1-3 of 3 Help

Selected(0)Clear Items/Page:    Sort:
Complete Strain Mapping of Nanosheets of Tantalum Disulfide 期刊论文
ACS APPLIED MATERIALS & INTERFACES, 2020, 卷号: 12, 期号: 38, 页码: 43173-43179
Authors:  Cao, Y;  Assefa, T;  Banerjee, S;  Wieteska, A;  Wang, DZR;  Pasupathy, A;  Tong, X;  Liu, Y;  Lu, WJ;  Sun, YP;  He, Y;  Huang, XJ;  Yan, HF;  Chu, YS;  Billinge, SJL;  Robinson, IK
View  |  Adobe PDF(2320Kb)  |  Favorite  |  View/Download:5/0  |  Submit date:2021/09/06
MONOLAYER  MICROSCOPY  
Resolving 500 nm axial separation by multi-slice X-ray ptychography 期刊论文
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2019, 卷号: 75, 期号: -, 页码: 336—341
Authors:  Huang, XJ;  Yan, HF;  He, Y;  Ge, MY;  Ozturk, H;  Fang, YLL;  Ha, S;  Lin, MF;  Lu, M;  Nazaretski, E;  Robinson, IK;  Chu, YS
View  |  Adobe PDF(850Kb)  |  Favorite  |  View/Download:72/6  |  Submit date:2019/12/30
HIGH-RESOLUTION  MICROSCOPY  CRYSTALLOGRAPHY  OPTIMIZATION  FLUORESCENCE  SCATTERING  DEPTH  
Multi-slice ptychography with large numerical aperture multilayer Laue lenses 期刊论文
OPTICA, 2018, 卷号: 5, 期号: 5, 页码: 601-607
Authors:  Ozturk, H;  Yan, HF;  He, Y;  Ge, MY;  Dong, ZH;  Lin, MF;  Nazaretski, E;  Robinson, IK;  Chu, YS;  Huang, XJ
View  |  Adobe PDF(1287Kb)  |  Favorite  |  View/Download:126/20  |  Submit date:2018/09/06
Ray-diffraction Microscopy  X-ray  Integrated-circuits  Scan Ptychography  Resolution  Nm  Scattering  Focus  Field